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Binnig, Rohrer, Gerber and Weibel: scanning tunneling microscopy

Demonstrated vacuum tunneling microscopy for mapping conducting surfaces with extremely fine spatial sensitivity.

What is recorded here?

Demonstrated vacuum tunneling microscopy for mapping conducting surfaces with extremely fine spatial sensitivity.

Source-linked catalogue note. A detailed explanatory guide has not yet been prepared for this entry.

Scientific scope

This is the 1982 four-author demonstration paper; later atomic manipulation, instrument refinements and other probe microscopes are separate.

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People and systems

Gerd Binnig; Heinrich Rohrer; Christoph Gerber; Edmund Weibel

The named authors contributed to this scoped work; individual effort shares and later applications are not assigned by the byline.

Research locations and affiliations

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Documented countries / regions: Switzerland

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English catalogue narrative

Binnig, Rohrer, Gerber and Weibel: scanning tunneling microscopy

Demonstrated vacuum tunneling microscopy for mapping conducting surfaces with extremely fine spatial sensitivity.

Scientific scope

This is the 1982 four-author demonstration paper; later atomic manipulation, instrument refinements and other probe microscopes are separate.

Reading status

This is a source-linked WRS catalogue note. A full explanatory guide and independent scientific reconstruction have not been completed for this entry. Read the identified original work for its complete narrative and arguments.

People and systems

Gerd Binnig; Heinrich Rohrer; Christoph Gerber; Edmund Weibel

The named authors contributed to this scoped work; individual effort shares and later applications are not assigned by the byline.

Original sources